Dual-Mode Operations of Self-Rectifying Ferroelectric Tunnel Junction Crosspoint Array for High-Density Integration of IoT Devices

Cited 6 time in webofscience Cited 0 time in scopus
  • Hit : 174
  • Download : 0
DC FieldValueLanguage
dc.contributor.authorLim, Seheeko
dc.contributor.authorGoh, Younginko
dc.contributor.authorLee, Young Kyuko
dc.contributor.authorKo, Dong Hanko
dc.contributor.authorHwang, Junghyeonko
dc.contributor.authorJeong, Yeongseokko
dc.contributor.authorShin, Hunbeomko
dc.contributor.authorJeon, Sanghunko
dc.contributor.authorJung, Seong-Ookko
dc.date.accessioned2023-07-19T02:00:31Z-
dc.date.available2023-07-19T02:00:31Z-
dc.date.created2023-05-30-
dc.date.issued2023-07-
dc.identifier.citationIEEE JOURNAL OF SOLID-STATE CIRCUITS, v.58, no.7, pp.1860 - 1870-
dc.identifier.issn0018-9200-
dc.identifier.urihttp://hdl.handle.net/10203/310593-
dc.description.abstractThis study proposes a self-rectifying ferroelectric tunnel junction (SR-FTJ) crosspoint array to satisfy the stringent size requirements of the Internet-of-Things devices. Each cell in the SR-FTJ crosspoint array consists of two SR-FTJs stacked vertically, resulting in ultrahigh density. The SR-FTJ crosspoint array can operate as: 1) ternary content-addressable memory (TCAM) or 2) binary content addressable memory (BCAM) or physically unclonable function (PUF) in the dual-mode operation. In the dual-mode operation, the amount of the current flowing through the SR-FTJs remains the same, resulting in a stable PUF response regardless of the BCAM data. The dual-mode operation of the SR-FTJ crosspoint array is experimentally verified by 4-in wafer-level demonstrations. HSPICE simulation results using the industrial-compatible 180-nm technology with the SR-FTJ model reflecting measured characteristics show that the SR-FTJ crosspoint array achieves the lowest search energy (2.05 fJ/search/bit) and the highest randomness (Hamming weight of 0.5000) among the previous content addressable memories (CAMs) and PUFs. In addition, the SR-FTJ crosspoint array reduces area by > 84.2% compared to the previous structures that implement individual CAM and PUF.-
dc.languageEnglish-
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC-
dc.titleDual-Mode Operations of Self-Rectifying Ferroelectric Tunnel Junction Crosspoint Array for High-Density Integration of IoT Devices-
dc.typeArticle-
dc.identifier.wosid000976065600001-
dc.identifier.scopusid2-s2.0-85153514651-
dc.type.rimsART-
dc.citation.volume58-
dc.citation.issue7-
dc.citation.beginningpage1860-
dc.citation.endingpage1870-
dc.citation.publicationnameIEEE JOURNAL OF SOLID-STATE CIRCUITS-
dc.identifier.doi10.1109/JSSC.2023.3265667-
dc.contributor.localauthorJeon, Sanghun-
dc.contributor.nonIdAuthorLim, Sehee-
dc.contributor.nonIdAuthorGoh, Youngin-
dc.contributor.nonIdAuthorLee, Young Kyu-
dc.contributor.nonIdAuthorKo, Dong Han-
dc.contributor.nonIdAuthorHwang, Junghyeon-
dc.contributor.nonIdAuthorJeong, Yeongseok-
dc.contributor.nonIdAuthorJung, Seong-Ook-
dc.description.isOpenAccessN-
dc.type.journalArticleArticle-
dc.subject.keywordAuthorArea efficiency-
dc.subject.keywordAuthorcontent addressable memory (CAM)-
dc.subject.keywordAuthorcrosspoint array-
dc.subject.keywordAuthordual-mode operation-
dc.subject.keywordAuthorInternet of Things (IoT)-
dc.subject.keywordAuthorleakage current-
dc.subject.keywordAuthorphysically unclonable function (PUF)-
dc.subject.keywordAuthorself-rectifying ferroelectric tunnel junction (SR-FTJ)-
dc.subject.keywordPlusCONTENT-ADDRESSABLE MEMORY-
dc.subject.keywordPlusDESIGN-
dc.subject.keywordPlusCELL-
Appears in Collection
EE-Journal Papers(저널논문)
Files in This Item
There are no files associated with this item.
This item is cited by other documents in WoS
⊙ Detail Information in WoSⓡ Click to see webofscience_button
⊙ Cited 6 items in WoS Click to see citing articles in records_button

qr_code

  • mendeley

    citeulike


rss_1.0 rss_2.0 atom_1.0