Assessment of PSD impact by pile-up effect and three-dimensional PSD method for high gamma-ray field

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Publisher
IEEE NPSS
Issue Date
2022-11-08
Language
English
Citation

2022 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room Temperature Semiconductor Detector Conferenc

URI
http://hdl.handle.net/10203/303994
Appears in Collection
NE-Conference Papers(학술회의논문)
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