A scatter artifact correction network in cone-beam CT using paired fan-beam slot scan data
- Publisher
- IEEE
- Issue Date
- 2022-10-10
- Language
- English
- Citation
2022 IEEE Nulcear Science Symposium, Medical Imaging Conference and Room Temperature Semiconductor Detector Conference
- ISSN
- 0278-0062
- Appears in Collection
- NE-Conference Papers(학술회의논문)
- Files in This Item
- There are no files associated with this item.
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