Training Multi-Exit Architectures via Block-Dependent Losses for Anytime Inference

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dc.contributor.authorHan, DongJunko
dc.contributor.authorPark, JungWukko
dc.contributor.authorHam, Seokilko
dc.contributor.authorLee, Namjinko
dc.contributor.authorMoon, Jaekyunko
dc.date.accessioned2022-11-28T08:04:38Z-
dc.date.available2022-11-28T08:04:38Z-
dc.date.created2022-11-28-
dc.date.issued2022-06-20-
dc.identifier.citation2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2022-
dc.identifier.urihttp://hdl.handle.net/10203/301180-
dc.description.abstractMulti-exit architecture is a promising solution that can make adaptive predictions via early exits, depending on the current test-time budget which may vary over time in practice (e.g., self-driving cars with dynamically changing speeds). Compared to the previous works where each block is optimized to minimize the losses of all exits simultaneously, we propose a new method for training multi-exit architectures by imposing different objectives to individual blocks. Our key idea is to design block-dependent losses based on grouping and overlapping strategies, which enables each k-th block to focus more on reducing the loss of the adjacent k-th exit while not degrading the prediction performance at later exits. This improves the prediction performance at the earlier exits, making our scheme to be more suitable for low-latency applications with a tight test-time budget. Experimental results on both image classification and semantic segmentation confirm the advantage of our approach for anytime prediction.-
dc.languageEnglish-
dc.publisherIEEE Computer Society-
dc.titleTraining Multi-Exit Architectures via Block-Dependent Losses for Anytime Inference-
dc.typeConference-
dc.type.rimsCONF-
dc.citation.publicationname2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2022-
dc.identifier.conferencecountryUS-
dc.identifier.conferencelocationNew Orleans, LA-
dc.contributor.localauthorMoon, Jaekyun-
dc.contributor.nonIdAuthorHam, Seokil-
dc.contributor.nonIdAuthorLee, Namjin-
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EE-Conference Papers(학술회의논문)
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