Masking Adversarial Damage: Finding Adversarial Saliency for Robust and Sparse Network

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dc.contributor.authorLee, Byung Kwanko
dc.contributor.authorKim, Junhoko
dc.contributor.authorRo, Yong Manko
dc.date.accessioned2022-11-18T02:01:04Z-
dc.date.available2022-11-18T02:01:04Z-
dc.date.created2022-03-04-
dc.date.created2022-03-04-
dc.date.created2022-03-04-
dc.date.issued2022-06-21-
dc.identifier.citationIEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2022, pp.15105 - 15115-
dc.identifier.issn1063-6919-
dc.identifier.urihttp://hdl.handle.net/10203/299895-
dc.description.abstractAdversarial examples provoke weak reliability and potential security issues in deep neural networks. Although adversarial training has been widely studied to improve adversarial robustness, it works in an over-parameterized regime and requires high computations and large memory budgets. To bridge adversarial robustness and model compression, we propose a novel adversarial pruning method, Masking Adversarial Damage (MAD) that employs second-order information of adversarial loss. By using it, we can accurately estimate adversarial saliency for model parameters and determine which parameters can be pruned without weakening adversarial robustness. Furthermore, we reveal that model parameters of initial layer are highly sensitive to the adversarial examples and show that compressed feature representation retains semantic information for the target objects. Through extensive experiments on three public datasets, we demonstrate that MAD effectively prunes adversarially trained networks without loosing adversarial robustness and shows better performance than previous adversarial pruning methods.-
dc.languageEnglish-
dc.publisherComputer Vision Foundation, IEEE Computer Society-
dc.titleMasking Adversarial Damage: Finding Adversarial Saliency for Robust and Sparse Network-
dc.typeConference-
dc.identifier.wosid000870783000067-
dc.identifier.scopusid2-s2.0-85141813342-
dc.type.rimsCONF-
dc.citation.beginningpage15105-
dc.citation.endingpage15115-
dc.citation.publicationnameIEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2022-
dc.identifier.conferencecountryUS-
dc.identifier.conferencelocationNew Orleans Ernest N.Morial Convention Center-
dc.identifier.doi10.1109/CVPR52688.2022.01470-
dc.contributor.localauthorRo, Yong Man-
dc.contributor.nonIdAuthorKim, Junho-
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EE-Conference Papers(학술회의논문)
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