Porous layer based memristor device development and memristor evaluation system implementation다공성 물질을 이용한 저항변화소자 제작 및 저항변화소자 측정 시스템 구축

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Recently, owing to the development of artificial intelligence and machine learning, artificial neural network attracts a lot of attention. As data become more complex and large, power consumption and speed issue due to the bottleneck between memory and processor become serious issue in conventional von Neumann structure. For implementing non-von Neumann structure, where memory and processor is merged in one device, memristor, which changes its resistance depending on voltage apply, is a reliable candidate. However, conventional memristor device suffers from various flaws to be used as a neuromorphic device. Among them, uniformity issue is most crucial issue, which has a large impact on the accuracy of entire machine learning process. For these reason, there have been several attempts to mitigate this issue. However, they have several drawbacks such as low CMOS compatibility and impossibility of stack. In this study, porous layer based memristor is suggested as a device that has high temporal and spatial uniformity, 3D stack possibility and CMOS compatibility. By alleviating conventional issue of memristor, it paves the way for memristor to be utilized as a reliable neuromorphic device. Moreover, in order to operate and evaluate the memristor array by computer command, evaluation system is implemented with DAQ, FPGA and PCB.
Advisors
Choi, Shinhyunresearcher최신현researcher
Description
한국과학기술원 :전기및전자공학부,
Publisher
한국과학기술원
Issue Date
2021
Identifier
325007
Language
eng
Description

학위논문(석사) - 한국과학기술원 : 전기및전자공학부, 2021.2,[iv, 36 p. :]

Keywords

memristor▼aporous switching layer▼auniformity▼a3D stack▼amemristor evaluation system; 멤리스터▼a다공성 물질▼a균일성▼a적층성▼a멤리스터 측정 및 평가 시스템

URI
http://hdl.handle.net/10203/296069
Link
http://library.kaist.ac.kr/search/detail/view.do?bibCtrlNo=948697&flag=dissertation
Appears in Collection
EE-Theses_Master(석사논문)
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