학위논문(박사) - 한국과학기술원 : 전기및전자공학부, 2021.2,[v, 61 p. :]
Ground integrity▼aTDMA noise▼ahigh bandwidth mermoy▼asimultaneous switching output noise▼aHBM; 접지 무결성▼a시분할다중접속 잡음▼a고대역폭 메모리▼a동시스위칭 출력회로 잡음▼a접지 잡음
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