Browse "AI-Conference Papers(학술대회논문)" by Author Bae, C.Y.

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Self-reference extended depth-of-field quantitative phase microscopy

Jang, J.; Bae, C.Y.; Park, J.-K.; Ye, Jong Chul, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XVII, 123, 2010-01-25

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