DC Field | Value | Language |
---|---|---|
dc.contributor.author | Han, Seong-Joo | ko |
dc.contributor.author | Han, Joon-Kyu | ko |
dc.contributor.author | Yun, Gyeong-Jun | ko |
dc.contributor.author | Lee, Mun-Woo | ko |
dc.contributor.author | Yu, Ji-Man | ko |
dc.contributor.author | Choi, Yang-Kyu | ko |
dc.date.accessioned | 2022-02-08T06:47:33Z | - |
dc.date.available | 2022-02-08T06:47:33Z | - |
dc.date.created | 2021-12-07 | - |
dc.date.created | 2021-12-07 | - |
dc.date.created | 2021-12-07 | - |
dc.date.created | 2021-12-07 | - |
dc.date.issued | 2022-01 | - |
dc.identifier.citation | SCIENTIFIC REPORTS, v.12, no.1 | - |
dc.identifier.issn | 2045-2322 | - |
dc.identifier.uri | http://hdl.handle.net/10203/292158 | - |
dc.description.abstract | Although SRAM is a well established type of volatile memory, data remanence has been observed at low temperature even for a power-off state, and thus it is vulnerable to a physical cold boot attack. To address this, an ultra-fast data sanitization method within 5 ns is demonstrated with physics-based simulations for avoidance of the cold boot attack to SRAM. Back-bias, which can control device parameters of CMOS, such as threshold voltage and leakage current, was utilized for the ultra-fast data sanitization. It is applicable to temporary erasing with data recoverability against a low-level attack as well as permanent erasing with data irrecoverability against a high-level attack. | - |
dc.language | English | - |
dc.publisher | NATURE RESEARCH | - |
dc.title | Ultra-fast Data Sanitization of SRAM by Back-biasing to Resist a Cold Boot Attack | - |
dc.type | Article | - |
dc.identifier.wosid | 000740510500143 | - |
dc.identifier.scopusid | 2-s2.0-85122447800 | - |
dc.type.rims | ART | - |
dc.citation.volume | 12 | - |
dc.citation.issue | 1 | - |
dc.citation.publicationname | SCIENTIFIC REPORTS | - |
dc.identifier.doi | 10.1038/s41598-021-03994-2 | - |
dc.contributor.localauthor | Choi, Yang-Kyu | - |
dc.contributor.nonIdAuthor | Han, Seong-Joo | - |
dc.contributor.nonIdAuthor | Yun, Gyeong-Jun | - |
dc.contributor.nonIdAuthor | Lee, Mun-Woo | - |
dc.description.isOpenAccess | N | - |
dc.type.journalArticle | Article | - |
dc.subject.keywordAuthor | Back-bias | - |
dc.subject.keywordAuthor | cold boot attack | - |
dc.subject.keywordAuthor | data sanitization | - |
dc.subject.keywordAuthor | security | - |
dc.subject.keywordAuthor | SRAM | - |
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