DC Field | Value | Language |
---|---|---|
dc.contributor.author | Lim, Younghyun | ko |
dc.contributor.author | Kim, Juyeop | ko |
dc.contributor.author | Jo, Yongwoo | ko |
dc.contributor.author | Bang, Jooeun | ko |
dc.contributor.author | Yoo, Seyeon | ko |
dc.contributor.author | Park, Hangi | ko |
dc.contributor.author | Yoon, Heein | ko |
dc.contributor.author | Choi, Jaehyouk | ko |
dc.date.accessioned | 2021-11-04T06:49:27Z | - |
dc.date.available | 2021-11-04T06:49:27Z | - |
dc.date.created | 2021-10-19 | - |
dc.date.created | 2021-10-19 | - |
dc.date.created | 2021-10-19 | - |
dc.date.issued | 2020-02-19 | - |
dc.identifier.citation | IEEE International Solid-State Circuits Conference (ISSCC), pp.280 - 282 | - |
dc.identifier.issn | 0193-6530 | - |
dc.identifier.uri | http://hdl.handle.net/10203/288835 | - |
dc.description.abstract | Sub-sampling PLLs (SSPLLs) are popular for generating low-jitter output signals. However, the critical problem of SSPLLs is that they do not use a frequency divider, so the lock-in range is strictly limited. The lock-in range is defined as the maximum instantaneous disturbance at which the PLL can recover its output frequency, fOUT, to the target frequency, fTA, [1], and the lock-in range of SSPLLs generally is restricted to less than 40% of the reference frequency, fREF [2]. As shown at the top left of Fig. 17.8.1, if a sudden frequency disturbance, fD, occurring through the supply or the control voltage is within the lock-in range, it can be corrected by the PLL, allowing fOUT to be recovered as fTA. However, if fD exceeds the lock-in range, it causes lock failure or false locking. As fOUT increases, the external disturbance with the same magnitude causes a larger fD which implies that the problem of the lock-in range is more serious when we aim for a higher fOUT given fTA. Despite their popularity, conventional frequency-locked loops (FLLs) [3], [4] require large power due to dividers operating at fOUT, To save power, the FLL in [2] operates once every 200 reference cycles, but this method has a problem in that the fD-detecting time increases in inverse proportion to the duty cycle of the FLL, which increases the overall frequency re-acquisition time, fRA. Another solution is to extend the lock-in range by increasing fREF However, when a reference multiplier is used in a conventional way, it requires large power, since every edge at the output must have very low jitter [5] to avoid deteriorating the PLL output jitter. It also degrades the resolution of the fOUT of integer-N PLLs [6]. | - |
dc.language | English | - |
dc.publisher | IEEE | - |
dc.title | A 170MHz-Lock-In-Range and-253dB-FoM(jitter), 12-to-14.5GHz Subsampling PLL with a 150 mu W Frequency-Disturbance-Correcting Loop Using a Low-Power Unevenly Spaced Edge Generator | - |
dc.type | Conference | - |
dc.identifier.wosid | 000570129800109 | - |
dc.identifier.scopusid | 2-s2.0-85083827488 | - |
dc.type.rims | CONF | - |
dc.citation.beginningpage | 280 | - |
dc.citation.endingpage | 282 | - |
dc.citation.publicationname | IEEE International Solid-State Circuits Conference (ISSCC) | - |
dc.identifier.conferencecountry | US | - |
dc.identifier.conferencelocation | San Francisco, CA | - |
dc.identifier.doi | 10.1109/ISSCC19947.2020.9062921 | - |
dc.contributor.localauthor | Choi, Jaehyouk | - |
dc.contributor.nonIdAuthor | Lim, Younghyun | - |
dc.contributor.nonIdAuthor | Kim, Juyeop | - |
dc.contributor.nonIdAuthor | Yoo, Seyeon | - |
dc.contributor.nonIdAuthor | Yoon, Heein | - |
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