A 170MHz-Lock-In-Range and-253dB-FoM(jitter), 12-to-14.5GHz Subsampling PLL with a 150 mu W Frequency-Disturbance-Correcting Loop Using a Low-Power Unevenly Spaced Edge Generator

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dc.contributor.authorLim, Younghyunko
dc.contributor.authorKim, Juyeopko
dc.contributor.authorJo, Yongwooko
dc.contributor.authorBang, Jooeunko
dc.contributor.authorYoo, Seyeonko
dc.contributor.authorPark, Hangiko
dc.contributor.authorYoon, Heeinko
dc.contributor.authorChoi, Jaehyoukko
dc.date.accessioned2021-11-04T06:49:27Z-
dc.date.available2021-11-04T06:49:27Z-
dc.date.created2021-10-19-
dc.date.created2021-10-19-
dc.date.created2021-10-19-
dc.date.issued2020-02-19-
dc.identifier.citationIEEE International Solid-State Circuits Conference (ISSCC), pp.280 - 282-
dc.identifier.issn0193-6530-
dc.identifier.urihttp://hdl.handle.net/10203/288835-
dc.description.abstractSub-sampling PLLs (SSPLLs) are popular for generating low-jitter output signals. However, the critical problem of SSPLLs is that they do not use a frequency divider, so the lock-in range is strictly limited. The lock-in range is defined as the maximum instantaneous disturbance at which the PLL can recover its output frequency, fOUT, to the target frequency, fTA, [1], and the lock-in range of SSPLLs generally is restricted to less than 40% of the reference frequency, fREF [2]. As shown at the top left of Fig. 17.8.1, if a sudden frequency disturbance, fD, occurring through the supply or the control voltage is within the lock-in range, it can be corrected by the PLL, allowing fOUT to be recovered as fTA. However, if fD exceeds the lock-in range, it causes lock failure or false locking. As fOUT increases, the external disturbance with the same magnitude causes a larger fD which implies that the problem of the lock-in range is more serious when we aim for a higher fOUT given fTA. Despite their popularity, conventional frequency-locked loops (FLLs) [3], [4] require large power due to dividers operating at fOUT, To save power, the FLL in [2] operates once every 200 reference cycles, but this method has a problem in that the fD-detecting time increases in inverse proportion to the duty cycle of the FLL, which increases the overall frequency re-acquisition time, fRA. Another solution is to extend the lock-in range by increasing fREF However, when a reference multiplier is used in a conventional way, it requires large power, since every edge at the output must have very low jitter [5] to avoid deteriorating the PLL output jitter. It also degrades the resolution of the fOUT of integer-N PLLs [6].-
dc.languageEnglish-
dc.publisherIEEE-
dc.titleA 170MHz-Lock-In-Range and-253dB-FoM(jitter), 12-to-14.5GHz Subsampling PLL with a 150 mu W Frequency-Disturbance-Correcting Loop Using a Low-Power Unevenly Spaced Edge Generator-
dc.typeConference-
dc.identifier.wosid000570129800109-
dc.identifier.scopusid2-s2.0-85083827488-
dc.type.rimsCONF-
dc.citation.beginningpage280-
dc.citation.endingpage282-
dc.citation.publicationnameIEEE International Solid-State Circuits Conference (ISSCC)-
dc.identifier.conferencecountryUS-
dc.identifier.conferencelocationSan Francisco, CA-
dc.identifier.doi10.1109/ISSCC19947.2020.9062921-
dc.contributor.localauthorChoi, Jaehyouk-
dc.contributor.nonIdAuthorLim, Younghyun-
dc.contributor.nonIdAuthorKim, Juyeop-
dc.contributor.nonIdAuthorYoo, Seyeon-
dc.contributor.nonIdAuthorYoon, Heein-
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