Nanoscale Focus Pinspot for High-Purity Quantum Emitters via Focused-Ion-Beam-Induced Luminescence Quenching

Cited 0 time in webofscience Cited 0 time in scopus
  • Hit : 53
  • Download : 0
DC FieldValueLanguage
dc.contributor.authorChoi, Minhoko
dc.contributor.authorJun, Seongmoonko
dc.contributor.authorWoo, Kie Youngko
dc.contributor.authorSong, Hyun Gyuko
dc.contributor.authorYeo, Hwan-Seopko
dc.contributor.authorChoi, Sunghanko
dc.contributor.authorPark, Doyounko
dc.contributor.authorPark, Chunghyunko
dc.contributor.authorCho, Yong-Hoonko
dc.date.accessioned2021-08-03T05:10:12Z-
dc.date.available2021-08-03T05:10:12Z-
dc.date.created2021-08-03-
dc.date.created2021-08-03-
dc.date.issued2021-06-
dc.identifier.citationACS NANO, v.15, no.7, pp.11317 - 11325-
dc.identifier.issn1936-0851-
dc.identifier.urihttp://hdl.handle.net/10203/286984-
dc.description.abstractEpitaxially grown quantum dots (QDs), especially embedded in photonic structures, play an essential role in various quantum photonic systems as on-demand single-photon sources. However, these QDs often suffer from adjacent unwanted emitters, which contribute to the background noise of the QD emission and fundamentally limit the single-photon purity. In this paper, a nanoscale focus pinspot (NFP) technique using focused-ion-beam-induced luminescence quenching enables us to improve single-photon purity from site-controlled QD as a proof-of-concept experiment. The optical quality of the QD emission is not degraded while the signal-to-noise ratio of the QD is improved. Moreover, the QD after the NFP technique reveals the single-photon nature at further elevated temperatures owing to the reduced background noise. As the NFP technique is nondestructive, it retains the apparent physical structures and photonic functions, thereby indicating its promising potential for applying diverse high-purity quantum emitters, particularly integrated in photonic devices and circuits.-
dc.languageEnglish-
dc.publisherAMER CHEMICAL SOC-
dc.titleNanoscale Focus Pinspot for High-Purity Quantum Emitters via Focused-Ion-Beam-Induced Luminescence Quenching-
dc.typeArticle-
dc.identifier.wosid000679406500031-
dc.identifier.scopusid2-s2.0-85110258935-
dc.type.rimsART-
dc.citation.volume15-
dc.citation.issue7-
dc.citation.beginningpage11317-
dc.citation.endingpage11325-
dc.citation.publicationnameACS NANO-
dc.identifier.doi10.1021/acsnano.1c00587-
dc.contributor.localauthorCho, Yong-Hoon-
dc.contributor.nonIdAuthorPark, Doyoun-
dc.description.isOpenAccessN-
dc.type.journalArticleArticle-
dc.subject.keywordAuthorfocused ion beam-
dc.subject.keywordAuthorhelium ion microscope-
dc.subject.keywordAuthorluminescence quenching-
dc.subject.keywordAuthorquantum dot-
dc.subject.keywordAuthorsingle-photon source-
dc.subject.keywordAuthorsingle-photon purity-
dc.subject.keywordPlusSINGLE-PHOTON EMISSION-
dc.subject.keywordPlusDOT-
dc.subject.keywordPlusTEMPERATURE-
dc.subject.keywordPlusINTEGRATION-
dc.subject.keywordPlusDAMAGE-
dc.subject.keywordPlusFLUORESCENCE-
dc.subject.keywordPlusDEFECTS-
dc.subject.keywordPlusSTRAIN-
dc.subject.keywordPlusENERGY-
Appears in Collection
PH-Journal Papers(저널논문)
Files in This Item
There are no files associated with this item.

qr_code

  • mendeley

    citeulike


rss_1.0 rss_2.0 atom_1.0