DC Field | Value | Language |
---|---|---|
dc.contributor.author | Jin, Yeonghoon | ko |
dc.contributor.author | Yu, Kyoungsik | ko |
dc.date.accessioned | 2021-07-29T08:30:05Z | - |
dc.date.available | 2021-07-29T08:30:05Z | - |
dc.date.created | 2021-07-29 | - |
dc.date.created | 2021-07-29 | - |
dc.date.created | 2021-07-29 | - |
dc.date.issued | 2021-09 | - |
dc.identifier.citation | JOURNAL OF PHYSICS D-APPLIED PHYSICS, v.54, no.39 | - |
dc.identifier.issn | 0022-3727 | - |
dc.identifier.uri | http://hdl.handle.net/10203/286914 | - |
dc.description.abstract | Two-dimensional (2D) materials have attracted great attention because of their unique physical properties and versatile applications in electronics and photonics. Following the trends of large-area 2D materials-based devices and systems implementation, large-area, high-throughput thickness and surface characterization techniques are required. Optics-based thin film characterization techniques have promising advantages in fast characterization speed, contactless large-area probing, and highly accurate measurement results. In this review, we overview optics-based methods for thickness and surface characterization of various 2D materials, including the use of optical reflection contrast, Raman spectroscopy, photoluminescence, optical interference effects, phase-shifting interferometry, nonlinear optical harmonic generations, and spectroscopic ellipsometry. | - |
dc.language | English | - |
dc.publisher | IOP PUBLISHING LTD | - |
dc.title | A review of optics-based methods for thickness and surface characterization of two-dimensional materials | - |
dc.type | Article | - |
dc.identifier.wosid | 000672940400001 | - |
dc.identifier.scopusid | 2-s2.0-85111212348 | - |
dc.type.rims | ART | - |
dc.citation.volume | 54 | - |
dc.citation.issue | 39 | - |
dc.citation.publicationname | JOURNAL OF PHYSICS D-APPLIED PHYSICS | - |
dc.identifier.doi | 10.1088/1361-6463/ac0f1f | - |
dc.contributor.localauthor | Yu, Kyoungsik | - |
dc.description.isOpenAccess | N | - |
dc.type.journalArticle | Review | - |
dc.subject.keywordAuthor | two-dimensional materials | - |
dc.subject.keywordAuthor | optics-based thickness determination | - |
dc.subject.keywordAuthor | surface characterization | - |
dc.subject.keywordPlus | HEXAGONAL BORON-NITRIDE | - |
dc.subject.keywordPlus | FEW-LAYER GRAPHENE | - |
dc.subject.keywordPlus | RAMAN-SPECTROSCOPY | - |
dc.subject.keywordPlus | THERMAL-CONDUCTIVITY | - |
dc.subject.keywordPlus | ELECTRONIC-STRUCTURE | - |
dc.subject.keywordPlus | BLACK PHOSPHORUS | - |
dc.subject.keywordPlus | BAND-GAP | - |
dc.subject.keywordPlus | NONDESTRUCTIVE IDENTIFICATION | - |
dc.subject.keywordPlus | 2ND-HARMONIC GENERATION | - |
dc.subject.keywordPlus | MOLYBDENUM-DISULFIDE | - |
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