Data Sanitization of SRAM by Thermal Distortion

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Thermal distortion of a memory state is demonstrated for data sanitization of static random access memory (SRAM). Data stored in SRAM are believed to be deleted when power is turned off. However, it has been reported that the data can remain for a certain time even in powered-off SRAM, especially in a low-temperature environment. When a cold boot attack is attempted at low temperature, the stored data in SRAM are secured by thermal distortion at induced high temperature. For an experimental demonstration of data sanitization, heat is intentionally applied to a commercial SRAM chip, which is connected with a Raspberry pi board to write and read data. Supportive circuit and thermal simulations are performed to analyze electrical and thermal characteristics during heat treatment.
Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Issue Date
2021-07
Language
English
Article Type
Article
Citation

IEEE TRANSACTIONS ON ELECTRON DEVICES, v.68, no.7, pp.3706 - 3710

ISSN
0018-9383
DOI
10.1109/TED.2021.3078667
URI
http://hdl.handle.net/10203/286773
Appears in Collection
EE-Journal Papers(저널논문)
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