In this study, we examined the dependence of surface morphology and spin Seebeck effect (SSE) voltages on the poly[vinylpyrrolidone] (PVP) concentration in polycrystalline Y3Fe5O12 (YIG) ultrathin films on a silicon substrate synthesized by metal-organic decomposition followed by a crystallization process. During fabrication, PVP concentrations of 0.5-2 g were used while all other conditions remained fixed. Atomic force microscopy and grazing incidence X-ray diffraction (XRD) measurements revealed a strong dependence of crystallinity and sample morphology on PVP concentration. The 1-g PVP sample had the smoothest surface, with a root mean square roughness of 0.2 nm, as well as superior bulk uniformity with respect to the shape and intensity of XRD reflection peaks. This was confirmed by scanning electron microscopy measurements of a cross-section of the sample that revealed a uniform film without pores. SSE measurements were performed to obtain the output SSE voltages (VSSE) of all samples, to which a platinum layer was added as a spin-detection layer. Repeatedly, the 1-g PVP sample had the best performance, demonstrating the importance of film crystallinity and morphology in the spin-to-charge conversion efficiency of YIG films.