DC Field | Value | Language |
---|---|---|
dc.contributor.author | Choi, Seongmin | ko |
dc.contributor.author | Lee, Dong-Geun | ko |
dc.contributor.author | Woo, H. J. | ko |
dc.contributor.author | Hong, S. H. | ko |
dc.contributor.author | Ham, Seunggi | ko |
dc.contributor.author | Ryu, Jonghyeon | ko |
dc.contributor.author | Chung, Kyoung-Jae | ko |
dc.contributor.author | Hwang, Y. S. | ko |
dc.contributor.author | Ghim, Young-Chul | ko |
dc.date.accessioned | 2021-05-18T01:30:33Z | - |
dc.date.available | 2021-05-18T01:30:33Z | - |
dc.date.created | 2021-05-17 | - |
dc.date.created | 2021-05-17 | - |
dc.date.issued | 2021-04 | - |
dc.identifier.citation | REVIEW OF SCIENTIFIC INSTRUMENTS, v.92, no.4 | - |
dc.identifier.issn | 0034-6748 | - |
dc.identifier.uri | http://hdl.handle.net/10203/285279 | - |
dc.description.abstract | Having a sub-ns response time and not requiring physical contacts to the measurement points, a voltage measurement system based on the Pockels electro-optic effect, referred to as a PE (Pockels effect)-based voltmeter, is widely used for pulsed high voltage devices such as accelerators and X-pinch systems. To correct for the misalignment of a Pockels cell and the transmittance ratio of a beam splitter, a polar-coordinate-based data analysis scheme has been proposed. This scheme also overcomes a limitation on the measurable range of a PE-based voltmeter without ambiguity and can measure the half-wave voltage of a Pockels cell. We present an improved polar-coordinate-based data analysis scheme using an ellipse fitting method, which can correct for misalignments of all the optics components of a PE-based voltmeter while keeping the advantages of the previous scheme. We show the results of the improved data analysis scheme for measuring a slowly modulated voltage up to approximately 5 kV in about 30 s and a pulsed high voltage up to 7 kV with a rise time of less than 20 ns. | - |
dc.language | English | - |
dc.publisher | AMER INST PHYSICS | - |
dc.title | Data analysis scheme for correcting general misalignments of an optics configuration for a voltage measurement system based on the Pockels electro-optic effect | - |
dc.type | Article | - |
dc.identifier.wosid | 000641770800001 | - |
dc.identifier.scopusid | 2-s2.0-85104508106 | - |
dc.type.rims | ART | - |
dc.citation.volume | 92 | - |
dc.citation.issue | 4 | - |
dc.citation.publicationname | REVIEW OF SCIENTIFIC INSTRUMENTS | - |
dc.identifier.doi | 10.1063/5.0040467 | - |
dc.contributor.localauthor | Ghim, Young-Chul | - |
dc.contributor.nonIdAuthor | Choi, Seongmin | - |
dc.contributor.nonIdAuthor | Woo, H. J. | - |
dc.contributor.nonIdAuthor | Hong, S. H. | - |
dc.contributor.nonIdAuthor | Ham, Seunggi | - |
dc.contributor.nonIdAuthor | Ryu, Jonghyeon | - |
dc.contributor.nonIdAuthor | Chung, Kyoung-Jae | - |
dc.contributor.nonIdAuthor | Hwang, Y. S. | - |
dc.description.isOpenAccess | N | - |
dc.type.journalArticle | Article | - |
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