APPARATUS FOR DETECTING SAMPLE PROPERTIES USING CHAOTIC WAVE SENSOR혼돈파 센서를 이용한 시료 특성 탐지 장치

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An embodiment of the present invention provides a sample property detection apparatus, including: a wave source for irradiating waves towards the sample; a detection section for detecting laser speckles generated by multiple scattering of the irradiated waves by the sample, and detecting the laser speckles at each preset time point; and a control unit configured to acquire a time correlation of the detected laser speckle with time and detect a characteristic of the sample in real time based on the acquired time correlation, wherein the detection unit detects the laser speckle between the sample and the detection unit or in an area inside the detection unit.
Assignee
KAIST
Country
CC (Cocos (Keeling) Islands)
Application Date
2016-11-17
Application Number
201680079041.1
Registration Date
2021-03-02
Registration Number
108474740
URI
http://hdl.handle.net/10203/281493
Appears in Collection
PH-Patent(특허)
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