DC Field | Value | Language |
---|---|---|
dc.contributor.author | Hu, Qi | ko |
dc.contributor.author | YOON, JEONG WHAN | ko |
dc.contributor.author | Hu, Q. | ko |
dc.contributor.author | Yoon, J. W. | ko |
dc.date.accessioned | 2021-02-04T06:30:21Z | - |
dc.date.available | 2021-02-04T06:30:21Z | - |
dc.date.created | 2021-02-04 | - |
dc.date.created | 2021-02-04 | - |
dc.date.issued | 2020-10 | - |
dc.identifier.citation | 39th International Deep-Drawing Research Group Conference, IDDRG 2020, v.967 | - |
dc.identifier.issn | 1757-8981 | - |
dc.identifier.uri | http://hdl.handle.net/10203/280575 | - |
dc.description.abstract | In this study, the perturbation approach for predicting material's forming limit strains under non-associated flow rule (non-AFR) is proposed. The influence of yield function and plastic potential function on the forming limit curve (FLC) evaluated by the perturbation approach are discussed through analyzing the normalized growth rate of a perturbation. In the framework of non-AFR, Hill'48 and Yld2000-2d are chosen for AA5754-O. The results show that the left side of FLCs predicted with the different forms of yield function and plastic potential nearly overlap. Hence, it is concluded that the yield function and plastic potential have a negligible influence on the forming limit strain under a negative strain path. However, the FLC under a positive strain path is principally dependent on the relationship between strain ratio ß and stress ratio a, which can be determined by the plastic potential. Additionally, in comparison to the FLC under AFR, an increase in the forming limits strain is observed near the plain strain region, when the derivative of the normalized yield function concerning a is positive and vice versa. | - |
dc.language | English | - |
dc.publisher | IOP Publishing | - |
dc.title | The roles of yield function and plastic potential under non-associated flow rule for formability prediction with perturbation approach | - |
dc.type | Conference | - |
dc.identifier.wosid | 000651080000027 | - |
dc.identifier.scopusid | 2-s2.0-85097195320 | - |
dc.type.rims | CONF | - |
dc.citation.volume | 967 | - |
dc.citation.publicationname | 39th International Deep-Drawing Research Group Conference, IDDRG 2020 | - |
dc.identifier.conferencecountry | KO | - |
dc.identifier.conferencelocation | Seoul | - |
dc.identifier.doi | 10.1088/1757-899x/967/1/012027 | - |
dc.contributor.localauthor | YOON, JEONG WHAN | - |
dc.contributor.localauthor | Yoon, J. W. | - |
dc.contributor.nonIdAuthor | Hu, Qi | - |
dc.contributor.nonIdAuthor | Hu, Q. | - |
dc.type.journalArticle | Proceedings Paper | - |
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.