Development of thermography based technique for automated detection and classification of defects in semiconductor lead frame
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Chung, Jun yeon | ko |
| dc.contributor.author | Sohn, Hoon | ko |
| dc.contributor.author | Kim, Chisung | ko |
| dc.contributor.author | Yi, Kiyoon | ko |
| dc.contributor.author | Park, Juneho | ko |
| dc.contributor.author | Ramos, Oliver | ko |
| dc.date.accessioned | 2021-01-28T06:09:33Z | - |
| dc.date.available | 2021-01-28T06:09:33Z | - |
| dc.date.created | 2020-12-01 | - |
| dc.date.issued | 2020-08-14 | - |
| dc.identifier.citation | 2020 Digital Thermography Workshop of Korean Society of Nondestructive Testing | - |
| dc.identifier.uri | http://hdl.handle.net/10203/280164 | - |
| dc.language | English | - |
| dc.publisher | Korean Society of Nondestructive Testing | - |
| dc.title | Development of thermography based technique for automated detection and classification of defects in semiconductor lead frame | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.citation.publicationname | 2020 Digital Thermography Workshop of Korean Society of Nondestructive Testing | - |
| dc.identifier.conferencecountry | KO | - |
| dc.identifier.conferencelocation | Online | - |
| dc.contributor.localauthor | Sohn, Hoon | - |
| dc.contributor.nonIdAuthor | Kim, Chisung | - |
| dc.contributor.nonIdAuthor | Yi, Kiyoon | - |
| dc.contributor.nonIdAuthor | Park, Juneho | - |
| dc.contributor.nonIdAuthor | Ramos, Oliver | - |
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