A Low-Jitter and Low-Reference-Spur Ring-VCO- Based Injection-Locked Clock Multiplier Using a Triple-Point Background Calibrator

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dc.contributor.authorYoo, Seyeonko
dc.contributor.authorChoi, Seojinko
dc.contributor.authorLee, Yongsunko
dc.contributor.authorSeong, Taehoko
dc.contributor.authorLim, Younghyunko
dc.contributor.authorChoi, Jaehyoukko
dc.date.accessioned2021-01-28T05:52:28Z-
dc.date.available2021-01-28T05:52:28Z-
dc.date.created2020-11-25-
dc.date.created2020-11-25-
dc.date.created2020-11-25-
dc.date.issued2021-01-
dc.identifier.citationIEEE JOURNAL OF SOLID-STATE CIRCUITS, v.56, no.1, pp.298 - 309-
dc.identifier.issn0018-9200-
dc.identifier.urihttp://hdl.handle.net/10203/280026-
dc.description.abstractThis work presents a low-jitter, low-reference-spur ring voltage-controlled oscillator (ring VCO)-based injection-locked clock multiplier (ILCM). Since the proposed triple-point frequency/phase/slope calibrator (TP-FPSC) can accurately remove the three root causes of the frequency errors of ILCMs (i.e., frequency drift, phase offset, and slope modulation), the ILCM of this work is able to achieve a low-level-reference spur. In addition, the calibrating loop for the frequency drift of the TP-FPSC offers an additional suppression to the in-band phase noise of the output signal. This capability of the TP-FPSC and the naturally wide bandwidth of the injection-locking mechanism allows the ILCM to achieve a very low-RMS jitter. The ILCM was fabricated in a 65-nm CMOS technology. The measured reference spur and RMS jitter of the 2.4-GHz output signal were -72 dBc and 140 fs, respectively, both of which are the best among the state-of-the-art ILCMs. The active silicon area was 0.055 mm², and the power consumption was 11.0 mW.-
dc.languageEnglish-
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC-
dc.titleA Low-Jitter and Low-Reference-Spur Ring-VCO- Based Injection-Locked Clock Multiplier Using a Triple-Point Background Calibrator-
dc.typeArticle-
dc.identifier.wosid000602700400025-
dc.identifier.scopusid2-s2.0-85098242798-
dc.type.rimsART-
dc.citation.volume56-
dc.citation.issue1-
dc.citation.beginningpage298-
dc.citation.endingpage309-
dc.citation.publicationnameIEEE JOURNAL OF SOLID-STATE CIRCUITS-
dc.identifier.doi10.1109/jssc.2020.2995326-
dc.contributor.localauthorChoi, Jaehyouk-
dc.contributor.nonIdAuthorYoo, Seyeon-
dc.contributor.nonIdAuthorChoi, Seojin-
dc.contributor.nonIdAuthorLee, Yongsun-
dc.contributor.nonIdAuthorSeong, Taeho-
dc.contributor.nonIdAuthorLim, Younghyun-
dc.description.isOpenAccessN-
dc.type.journalArticleArticle-
dc.subject.keywordAuthorVoltage-controlled oscillators-
dc.subject.keywordAuthorJitter-
dc.subject.keywordAuthorClocks-
dc.subject.keywordAuthorPhase locked loops-
dc.subject.keywordAuthorFrequency modulation-
dc.subject.keywordAuthorPhase modulation-
dc.subject.keywordAuthorCalibration-
dc.subject.keywordAuthorCalibrator-
dc.subject.keywordAuthorfrequency error-
dc.subject.keywordAuthorinjection-locked clock multiplier (ILCM)-
dc.subject.keywordAuthorphase noise-
dc.subject.keywordAuthorreference spur-
dc.subject.keywordAuthorRMS jitter-
dc.subject.keywordAuthorslope modulation-
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