Selective patterning of out-of-plane piezoelectricity in MoTe2 via focused ion beam

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dc.contributor.authorSeol, Daeheeko
dc.contributor.authorKim, Songkilko
dc.contributor.authorJang, Woo-Sungko
dc.contributor.authorJin, Yeongrokko
dc.contributor.authorKang, Seunghunko
dc.contributor.authorKim, Serako
dc.contributor.authorWon, Dongyeunko
dc.contributor.authorLee, Chanwooko
dc.contributor.authorKim, Young-Minko
dc.contributor.authorLee, Jaekwangko
dc.contributor.authorYANG, HeeJunko
dc.contributor.authorJeong, Mun Seokko
dc.contributor.authorBelianinov, Alexko
dc.contributor.authorTselev, Alexanderko
dc.contributor.authorSomnath, Suhasko
dc.contributor.authorSmith, Christopher R.ko
dc.contributor.authorOvchinnikova, Olga S.ko
dc.contributor.authorBalke, Ninako
dc.contributor.authorKim, Yunseokko
dc.date.accessioned2021-01-28T05:51:22Z-
dc.date.available2021-01-28T05:51:22Z-
dc.date.created2021-01-27-
dc.date.created2021-01-27-
dc.date.created2021-01-27-
dc.date.created2021-01-27-
dc.date.issued2021-01-
dc.identifier.citationNANO ENERGY, v.79, pp.105451-
dc.identifier.issn2211-2855-
dc.identifier.urihttp://hdl.handle.net/10203/280007-
dc.description.abstractTwo-dimensional transition-metal dichalcogenides (TMDs) have a strain-sensitive nature and can only exhibit in-plane piezoelectricity, owing to their in-plane inversion symmetry breaking, which limits their practical applications for vertical stimulations. In this study, we demonstrated the capability of focused ion beams to create out-of-plane piezoelectricity on multi-layered MoTe-
dc.languageEnglish-
dc.publisherELSEVIER-
dc.titleSelective patterning of out-of-plane piezoelectricity in MoTe2 via focused ion beam-
dc.typeArticle-
dc.identifier.wosid000620324700005-
dc.identifier.scopusid2-s2.0-85092187825-
dc.type.rimsART-
dc.citation.volume79-
dc.citation.beginningpage105451-
dc.citation.publicationnameNANO ENERGY-
dc.identifier.doi10.1016/j.nanoen.2020.105451-
dc.contributor.localauthorYANG, HeeJun-
dc.contributor.nonIdAuthorSeol, Daehee-
dc.contributor.nonIdAuthorKim, Songkil-
dc.contributor.nonIdAuthorJang, Woo-Sung-
dc.contributor.nonIdAuthorJin, Yeongrok-
dc.contributor.nonIdAuthorKang, Seunghun-
dc.contributor.nonIdAuthorKim, Sera-
dc.contributor.nonIdAuthorWon, Dongyeun-
dc.contributor.nonIdAuthorLee, Chanwoo-
dc.contributor.nonIdAuthorKim, Young-Min-
dc.contributor.nonIdAuthorLee, Jaekwang-
dc.contributor.nonIdAuthorJeong, Mun Seok-
dc.contributor.nonIdAuthorBelianinov, Alex-
dc.contributor.nonIdAuthorTselev, Alexander-
dc.contributor.nonIdAuthorSomnath, Suhas-
dc.contributor.nonIdAuthorSmith, Christopher R.-
dc.contributor.nonIdAuthorOvchinnikova, Olga S.-
dc.contributor.nonIdAuthorBalke, Nina-
dc.contributor.nonIdAuthorKim, Yunseok-
dc.description.isOpenAccessN-
dc.type.journalArticleArticle-
dc.subject.keywordAuthorTransition-metal dichalcogenides-
dc.subject.keywordAuthorOut-of-plane piezoelectricity-
dc.subject.keywordAuthorDefect formation-
dc.subject.keywordAuthorInversion symmetry breaking-
dc.subject.keywordAuthorIon beam irradiation-
dc.subject.keywordPlusATOMIC-LAYER MOS2-
dc.subject.keywordPlusCARBON CONTAMINATION-
dc.subject.keywordPlusTRANSPORT-PROPERTIES-
dc.subject.keywordPlusFORCE MICROSCOPY-
dc.subject.keywordPlusMONOLAYER MOS2-
dc.subject.keywordPlusTRANSITION-
dc.subject.keywordPlusSUBSURFACE-
dc.subject.keywordPlusENERGY-
dc.subject.keywordPlusDAMAGE-
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