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College of Engineering(공과대학)School of Electrical Engineering(전기및전자공학부)EE-Conference Papers(학술회의논문)

Protecting the spin coherence of silicon vacancy color centers from thermal noise using diamond MEMS

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dc.contributor.authorSohn, Youngikko
dc.contributor.authorMeesala, Srujanko
dc.contributor.authorPingault, Benjaminko
dc.contributor.authorAtikian, Haig A.ko
dc.contributor.authorHolzgrafe, Jeffreyko
dc.contributor.authorGündogan, Mustafako
dc.contributor.authorStavrakas, Camilleko
dc.contributor.authorSipahigil, Alpko
dc.contributor.authorBurek, Michael J.ko
dc.contributor.authorZhang, Mianko
dc.contributor.authorPacheco, Jose L.ko
dc.contributor.authorAbraham, Johnko
dc.contributor.authorBielejec, Edwardko
dc.contributor.authorLukin, Mikhail D.ko
dc.contributor.authorAtatüre, Meteko
dc.contributor.authorLoncar, Makoko
dc.date.accessioned2020-12-21T02:50:18Z-
dc.date.available2020-12-21T02:50:18Z-
dc.date.created2020-12-02-
dc.date.issued2017-05-
dc.identifier.citation2017 Conference on Lasers and Electro-Optics, CLEO 2017, pp.1 - 2-
dc.identifier.issn2160-9020-
dc.identifier.urihttp://hdl.handle.net/10203/278809-
dc.description.abstractSpin coherence time, T2∗, of the silicon vacancy color center in diamond is limited by thermal phonons existing in the lattice. We show how this process can be engineered by applying static strain using a micro-electro-mechanical system (MEMS) fabricated on diamond. By suppressing the relevant thermal process, we demonstrate the improvement of spin T2∗.-
dc.languageEnglish-
dc.publisherInstitute of Electrical and Electronics Engineers Inc.-
dc.titleProtecting the spin coherence of silicon vacancy color centers from thermal noise using diamond MEMS-
dc.typeConference-
dc.identifier.wosid000427296200416-
dc.identifier.scopusid2-s2.0-85044219685-
dc.type.rimsCONF-
dc.citation.beginningpage1-
dc.citation.endingpage2-
dc.citation.publicationname2017 Conference on Lasers and Electro-Optics, CLEO 2017-
dc.identifier.conferencecountryUS-
dc.identifier.conferencelocationSan Jose-
dc.identifier.doi10.1364/CLEO_QELS.2017.FTu1E.6-
dc.contributor.localauthorSohn, Youngik-
dc.contributor.nonIdAuthorMeesala, Srujan-
dc.contributor.nonIdAuthorPingault, Benjamin-
dc.contributor.nonIdAuthorAtikian, Haig A.-
dc.contributor.nonIdAuthorHolzgrafe, Jeffrey-
dc.contributor.nonIdAuthorGündogan, Mustafa-
dc.contributor.nonIdAuthorStavrakas, Camille-
dc.contributor.nonIdAuthorSipahigil, Alp-
dc.contributor.nonIdAuthorBurek, Michael J.-
dc.contributor.nonIdAuthorZhang, Mian-
dc.contributor.nonIdAuthorPacheco, Jose L.-
dc.contributor.nonIdAuthorAbraham, John-
dc.contributor.nonIdAuthorBielejec, Edward-
dc.contributor.nonIdAuthorLukin, Mikhail D.-
dc.contributor.nonIdAuthorAtatüre, Mete-
dc.contributor.nonIdAuthorLoncar, Mako-
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EE-Conference Papers(학술회의논문)
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