DC Field | Value | Language |
---|---|---|
dc.contributor.author | Lee, Seungkyeong | ko |
dc.contributor.author | Koo, Hyunji | ko |
dc.contributor.author | Yang, Kyoung-Hoon | ko |
dc.contributor.author | Hong, Songcheol | ko |
dc.date.accessioned | 2020-11-30T11:30:28Z | - |
dc.date.available | 2020-11-30T11:30:28Z | - |
dc.date.created | 2020-11-27 | - |
dc.date.created | 2020-11-27 | - |
dc.date.issued | 2019-12 | - |
dc.identifier.citation | 2019 IEEE Asia-Pacific Microwave Conference, APMC 2019, pp.1241 - 1243 | - |
dc.identifier.uri | http://hdl.handle.net/10203/277777 | - |
dc.description.abstract | In this paper, on-chip de-embedding methods are compared by applying to transistor characterization for up to 110-GHz. 2-step and 3-step methods, based on lumped circuit models, and hybrid methods, which are a combination of a cascade model and the lumped circuit model, are studied. For cascade models of the hybrid methods, two sets of de-embedding structures are adopted - (LINE, PAD-LINE) and (THRU LR, THRU LLR) are used for the hybrid-1 method and hybrid-2 method, respectively. A single transistor is used as a device under test (DUT) and all de-embedding patterns for the four methods are implemented with 28-nm fully depleted silicon on insulator (FDSOI) process. Transistor characteristics including gate resistance and parasitic capacitances of FDSOI MOSFETs are extracted and analyzed. In addition, ft and f max of the device are estimated by using the hybrid-1 method. | - |
dc.language | English | - |
dc.publisher | Asia-Pacific Microwave Conference(APMC) Committee/ IEEE | - |
dc.title | Comparison of On-chip De-embedding Methods with 28-nm FDSOI MOSFETs up to 110-GHz | - |
dc.type | Conference | - |
dc.identifier.wosid | 000565730300418 | - |
dc.identifier.scopusid | 2-s2.0-85082986009 | - |
dc.type.rims | CONF | - |
dc.citation.beginningpage | 1241 | - |
dc.citation.endingpage | 1243 | - |
dc.citation.publicationname | 2019 IEEE Asia-Pacific Microwave Conference, APMC 2019 | - |
dc.identifier.conferencecountry | SI | - |
dc.identifier.conferencelocation | Singapore | - |
dc.identifier.doi | 10.1109/APMC46564.2019.9038233 | - |
dc.contributor.localauthor | Yang, Kyoung-Hoon | - |
dc.contributor.localauthor | Hong, Songcheol | - |
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