DC Field | Value | Language |
---|---|---|
dc.contributor.author | Han, Hoonhee | ko |
dc.contributor.author | Cho, Byung-Jin | ko |
dc.contributor.author | Choi, Rino | ko |
dc.contributor.author | Jung, Seong-Ook | ko |
dc.contributor.author | S. C. Song | ko |
dc.contributor.author | Choi, Changhwan | ko |
dc.contributor.author | Chung, SungWoo | ko |
dc.date.accessioned | 2020-11-30T08:50:31Z | - |
dc.date.available | 2020-11-30T08:50:31Z | - |
dc.date.created | 2020-11-27 | - |
dc.date.created | 2020-11-27 | - |
dc.date.issued | 2020-12-15 | - |
dc.identifier.citation | 66th IEEE INTERNATIONAL ELECTRON DEVICES MEETING (IEDM) | - |
dc.identifier.uri | http://hdl.handle.net/10203/277756 | - |
dc.language | English | - |
dc.publisher | IEEE | - |
dc.title | Low Temperature and Ion-Cut Based Monolithic 3D Process Integration Platform Incorporated with CMOS, RRAM and Photo-Sensor Circuits | - |
dc.type | Conference | - |
dc.identifier.scopusid | 2-s2.0-85102961994 | - |
dc.type.rims | CONF | - |
dc.citation.publicationname | 66th IEEE INTERNATIONAL ELECTRON DEVICES MEETING (IEDM) | - |
dc.identifier.conferencecountry | US | - |
dc.identifier.conferencelocation | Virtual | - |
dc.identifier.doi | 10.1109/IEDM13553.2020.9372102 | - |
dc.contributor.localauthor | Cho, Byung-Jin | - |
dc.contributor.nonIdAuthor | Han, Hoonhee | - |
dc.contributor.nonIdAuthor | Choi, Rino | - |
dc.contributor.nonIdAuthor | Jung, Seong-Ook | - |
dc.contributor.nonIdAuthor | S. C. Song | - |
dc.contributor.nonIdAuthor | Choi, Changhwan | - |
dc.contributor.nonIdAuthor | Chung, SungWoo | - |
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