DC Field | Value | Language |
---|---|---|
dc.contributor.author | Choi, Byoung-Soo | ko |
dc.contributor.author | Lee, Jimin | ko |
dc.contributor.author | Kim, Sang-Hwan | ko |
dc.contributor.author | Lee, Jewon | ko |
dc.contributor.author | Lee, Junwoo | ko |
dc.contributor.author | Chang, Seunghyuk | ko |
dc.contributor.author | Park, JongHo | ko |
dc.contributor.author | Lee, Sang-Jin | ko |
dc.contributor.author | Shin, Jang-Kyoo | ko |
dc.date.accessioned | 2020-06-29T06:20:17Z | - |
dc.date.available | 2020-06-29T06:20:17Z | - |
dc.date.created | 2020-06-17 | - |
dc.date.issued | 2019-04 | - |
dc.identifier.citation | Conference on Image Sensing Technologies - Materials, Devices, Systems, and Applications VI | - |
dc.identifier.issn | 0277-786X | - |
dc.identifier.uri | http://hdl.handle.net/10203/274961 | - |
dc.description.abstract | A CMOS image sensor with off-center circular apertures for two-dimensional (2D) and three-dimensional (3D) imaging was fabricated, and its performance was evaluated, including the results of 2D and 3D images. The pixel size, based on a four-transistor active pixel sensor with a pinned photodiode, is 2.8 mu m x 2.8 mu m. Disparate images as well as focused images for depth calculation can be obtained using the designed pixel pattern. The pixel pattern is composed of one white subpixel with a left-offset circular aperture, a blue pixel, a red pixel, and another white subpixel with a right-offset circular aperture. The proposed technique was verified by simulation and measurement results using a point light source. In addition, the depth image was implemented by calculating the depth information from the 2D images. | - |
dc.language | English | - |
dc.publisher | SPIE-INT SOC OPTICAL ENGINEERING | - |
dc.title | CMOS image sensor with off-center circular apertures for depth extraction | - |
dc.type | Conference | - |
dc.identifier.wosid | 000484725600021 | - |
dc.identifier.scopusid | 2-s2.0-85069676830 | - |
dc.type.rims | CONF | - |
dc.citation.publicationname | Conference on Image Sensing Technologies - Materials, Devices, Systems, and Applications VI | - |
dc.identifier.conferencecountry | US | - |
dc.identifier.conferencelocation | Baltimore, MD | - |
dc.identifier.doi | 10.1117/12.2518802 | - |
dc.contributor.nonIdAuthor | Choi, Byoung-Soo | - |
dc.contributor.nonIdAuthor | Lee, Jimin | - |
dc.contributor.nonIdAuthor | Kim, Sang-Hwan | - |
dc.contributor.nonIdAuthor | Lee, Jewon | - |
dc.contributor.nonIdAuthor | Lee, Junwoo | - |
dc.contributor.nonIdAuthor | Chang, Seunghyuk | - |
dc.contributor.nonIdAuthor | Park, JongHo | - |
dc.contributor.nonIdAuthor | Shin, Jang-Kyoo | - |
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