DC Field | Value | Language |
---|---|---|
dc.contributor.author | Zhang, Shuye | ko |
dc.contributor.author | Yang, Ming | ko |
dc.contributor.author | Zhang, Yanxin | ko |
dc.contributor.author | Wang, Qian | ko |
dc.contributor.author | Lin, Tiesong | ko |
dc.contributor.author | He, Peng | ko |
dc.contributor.author | Paik, Kyung-Wook | ko |
dc.date.accessioned | 2020-06-25T03:20:28Z | - |
dc.date.available | 2020-06-25T03:20:28Z | - |
dc.date.created | 2020-06-11 | - |
dc.date.created | 2020-06-11 | - |
dc.date.issued | 2018-12 | - |
dc.identifier.citation | 20th International Conference on Electronic Materials and Packaging (EMAP) | - |
dc.identifier.issn | 2151-7231 | - |
dc.identifier.uri | http://hdl.handle.net/10203/274882 | - |
dc.description.abstract | For the development of electronic packaging products, the mixture of micron-filler and nano-filler was adopted to improve the electronic property of conductive adhesive. The porpose of the addition of micron-filler and nano-filler is to achieve a higher conductive property, so that the perfect conductive adhesive could be obtained by the optimized conductive fillers. The conductive filler composed of Cu powders coated by nano-Ag layer and silver nanowire and resin matrix were mixed to fabricate conductive adhesive. The conductive filler composed of Cu powder coated by nano-Ag layer and silver nanowire could reduce the bulk resistivity and percolation threshold of conductive adhesive. When the conductive adhesive was cured at 170 degrees C for 60min using Cu powder coated by nano-Ag layer and silver nanowire as conductive filler and the content of filler was 60wt.%, the bulk resistivity of the newly formed conductive adhesive was low to 6.53 x10-5 Omega.cm, while the shear strength of the adhesive was 5.36MPa. | - |
dc.language | English | - |
dc.publisher | IEEE | - |
dc.title | A Study on the Preparation and Properties of Conductive Adhesive Filled with Multi-component Fillers for Green Packaging | - |
dc.type | Conference | - |
dc.identifier.wosid | 000462858300012 | - |
dc.identifier.scopusid | 2-s2.0-85063906256 | - |
dc.type.rims | CONF | - |
dc.citation.publicationname | 20th International Conference on Electronic Materials and Packaging (EMAP) | - |
dc.identifier.conferencecountry | HK | - |
dc.identifier.conferencelocation | Clear Water Bay, Hong Kong | - |
dc.identifier.doi | 10.1109/EMAP.2018.8660805 | - |
dc.contributor.localauthor | Paik, Kyung-Wook | - |
dc.contributor.nonIdAuthor | Zhang, Shuye | - |
dc.contributor.nonIdAuthor | Yang, Ming | - |
dc.contributor.nonIdAuthor | Zhang, Yanxin | - |
dc.contributor.nonIdAuthor | Wang, Qian | - |
dc.contributor.nonIdAuthor | Lin, Tiesong | - |
dc.contributor.nonIdAuthor | He, Peng | - |
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