DC Field | Value | Language |
---|---|---|
dc.contributor.author | Kim, Seung-Woo | ko |
dc.contributor.author | Hyug-Gyo Rhee | ko |
dc.contributor.author | Jiyoung Joo | ko |
dc.contributor.author | KIM, Young-Jin | ko |
dc.date.accessioned | 2020-03-19T07:20:38Z | - |
dc.date.available | 2020-03-19T07:20:38Z | - |
dc.date.created | 2019-12-27 | - |
dc.date.issued | 2004-08 | - |
dc.identifier.citation | Optical Science and Technology, the SPIE 49th Annual Meeting, 2004 | - |
dc.identifier.uri | http://hdl.handle.net/10203/273308 | - |
dc.description.abstract | We describe a novel method of measuring absolute distances by using a two-point diffraction source specially devised to generate two high quality spherical waves simultaneously with a small lateral offset. Interference of the generated two spherical waves produces a unique ellipsoidal phase distribution in the measurement space. A partial map of the resulted interference phase field is sampled and fitted to a geometric model of multilateration that allows absolute-distance measurements to be performed without 2π-ambiguity. The partial phase map may be obtained by use of either homodyne or heterodyne phase measuring technique. Test results demonstrate that high precision with 1 part in 106 uncertainty can be achieved over 1 meter distance range. | - |
dc.language | English | - |
dc.publisher | SPIE | - |
dc.title | Two-point Diffraction Interferometer for Absolute Distance Measurement | - |
dc.type | Conference | - |
dc.type.rims | CONF | - |
dc.citation.publicationname | Optical Science and Technology, the SPIE 49th Annual Meeting, 2004 | - |
dc.identifier.conferencecountry | US | - |
dc.identifier.conferencelocation | Denver, Colorado | - |
dc.identifier.doi | 10.1117/12.558834 | - |
dc.contributor.localauthor | Kim, Seung-Woo | - |
dc.contributor.nonIdAuthor | Hyug-Gyo Rhee | - |
dc.contributor.nonIdAuthor | Jiyoung Joo | - |
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