New Precision Dimensional Metrology using Femtosecond Pulse Lasers
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | KIM, Young-Jin | ko |
| dc.date.accessioned | 2020-03-19T07:20:31Z | - |
| dc.date.available | 2020-03-19T07:20:31Z | - |
| dc.date.created | 2019-12-27 | - |
| dc.date.created | 2019-12-27 | - |
| dc.date.issued | 2005-05 | - |
| dc.identifier.citation | International Conference of the European Society for Precision Engineering and Nanotechnology (EUSPEN) 2005, pp.135 - 138 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/273306 | - |
| dc.language | English | - |
| dc.publisher | European Society for Precision Engineering and Nanotechnology | - |
| dc.title | New Precision Dimensional Metrology using Femtosecond Pulse Lasers | - |
| dc.type | Conference | - |
| dc.identifier.scopusid | 2-s2.0-84919928563 | - |
| dc.type.rims | CONF | - |
| dc.citation.beginningpage | 135 | - |
| dc.citation.endingpage | 138 | - |
| dc.citation.publicationname | International Conference of the European Society for Precision Engineering and Nanotechnology (EUSPEN) 2005 | - |
| dc.identifier.conferencecountry | FR | - |
| dc.identifier.conferencelocation | Montpellier | - |
| dc.contributor.localauthor | KIM, Young-Jin | - |
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