Absolute Length Metrology using a Femtosecond Pulse Laser (I)
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Jin, Jong-Han | ko |
| dc.contributor.author | KIM, Young-Jin | ko |
| dc.contributor.author | Kim, Yun-Seok | ko |
| dc.contributor.author | Kim, Seung-Woo | ko |
| dc.date.accessioned | 2020-03-19T06:27:16Z | - |
| dc.date.available | 2020-03-19T06:27:16Z | - |
| dc.date.created | 2019-12-27 | - |
| dc.date.issued | 2006-12 | - |
| dc.identifier.citation | KAIST-NMIJ Joint-Workshop 2006 on Precision Metrology, 2006 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/273288 | - |
| dc.language | English | - |
| dc.publisher | KAIST | - |
| dc.title | Absolute Length Metrology using a Femtosecond Pulse Laser (I) | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.citation.publicationname | KAIST-NMIJ Joint-Workshop 2006 on Precision Metrology, 2006 | - |
| dc.identifier.conferencecountry | KO | - |
| dc.contributor.localauthor | Kim, Seung-Woo | - |
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