Absolute Distance Measurement by High-resolution Time-of-flight Principle using a Femtosecond Laser

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dc.contributor.authorLee, Jko
dc.contributor.authorKIM, Young-Jinko
dc.contributor.authorLee, Kko
dc.contributor.authorLee, SHko
dc.contributor.authorKim, Seung-Wooko
dc.date.accessioned2020-03-19T06:21:56Z-
dc.date.available2020-03-19T06:21:56Z-
dc.date.created2019-12-30-
dc.date.issued2011-07-
dc.identifier.citationThe 10th International Symposium on Measurement Technology and Intelligent Instruments (ISMTII 2011)-
dc.identifier.urihttp://hdl.handle.net/10203/273224-
dc.languageEnglish-
dc.publisherICMI (The International Committee on Measurements and Instrumentation)-
dc.titleAbsolute Distance Measurement by High-resolution Time-of-flight Principle using a Femtosecond Laser-
dc.typeConference-
dc.type.rimsCONF-
dc.citation.publicationnameThe 10th International Symposium on Measurement Technology and Intelligent Instruments (ISMTII 2011)-
dc.identifier.conferencecountryKO-
dc.contributor.localauthorKim, Seung-Woo-
dc.contributor.nonIdAuthorLee, J-
dc.contributor.nonIdAuthorLee, K-
dc.contributor.nonIdAuthorLee, SH-
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ME-Conference Papers(학술회의논문)
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