Precision 3-D Surface Metrology Using Mode-locked Femtosecond Laser Pulses
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | KIM, Young-Jin | ko |
| dc.date.accessioned | 2020-03-19T05:22:50Z | - |
| dc.date.available | 2020-03-19T05:22:50Z | - |
| dc.date.created | 2019-12-30 | - |
| dc.date.issued | 2015-07 | - |
| dc.identifier.citation | International Symposium on Surface Topography and Optical Microscopy 2015 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/273138 | - |
| dc.language | English | - |
| dc.publisher | International Symposium on Surface Topography and Optical Microscopy (IS2TOM) | - |
| dc.title | Precision 3-D Surface Metrology Using Mode-locked Femtosecond Laser Pulses | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.citation.publicationname | International Symposium on Surface Topography and Optical Microscopy 2015 | - |
| dc.identifier.conferencecountry | CC | - |
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