Absolute Distance Interferometer with Nanometer Uncertainty
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | KIM, Young-Jin | ko |
| dc.date.accessioned | 2019-12-30T06:21:08Z | - |
| dc.date.available | 2019-12-30T06:21:08Z | - |
| dc.date.created | 2019-12-30 | - |
| dc.date.issued | 2016-11 | - |
| dc.identifier.citation | International Conference on Positioning Technology (ICPT) 2016 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/270719 | - |
| dc.language | English | - |
| dc.publisher | International Conference on Positioning Technology (ICPT) | - |
| dc.title | Absolute Distance Interferometer with Nanometer Uncertainty | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.citation.publicationname | International Conference on Positioning Technology (ICPT) 2016 | - |
| dc.identifier.conferencecountry | KO | - |
| dc.identifier.conferencelocation | Seoul | - |
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