Atomistic origins of low-resistance metal contacts to phase-engineered MoS2

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dc.contributor.authorKim, Taehyeongko
dc.contributor.authorKim, Yong-Hoonko
dc.date.accessioned2019-12-13T10:26:25Z-
dc.date.available2019-12-13T10:26:25Z-
dc.date.created2019-11-26-
dc.date.issued2019-07-26-
dc.identifier.citationThe 10th International Conference of the Asian Consortium on Computational Materials Science (ACCMS-10)-
dc.identifier.urihttp://hdl.handle.net/10203/269339-
dc.languageEnglish-
dc.publisherDepartment of Chemistry, City University of Hong Kong-
dc.titleAtomistic origins of low-resistance metal contacts to phase-engineered MoS2-
dc.typeConference-
dc.type.rimsCONF-
dc.citation.publicationnameThe 10th International Conference of the Asian Consortium on Computational Materials Science (ACCMS-10)-
dc.identifier.conferencecountryHK-
dc.identifier.conferencelocationCity University of Hong Kong-
dc.contributor.localauthorKim, Yong-Hoon-
dc.contributor.nonIdAuthorKim, Taehyeong-
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EEW-Conference Papers(학술회의논문)
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