Advanced Optical Metrology Using Ultrashort Pulse Lasers
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Kim, Seung-Woo | ko |
| dc.contributor.author | KIM, Young-Jin | ko |
| dc.date.accessioned | 2019-11-29T06:20:04Z | - |
| dc.date.available | 2019-11-29T06:20:04Z | - |
| dc.date.created | 2019-11-28 | - |
| dc.date.created | 2019-11-28 | - |
| dc.date.issued | 2008-12 | - |
| dc.identifier.citation | The Review of Laser Engineering, v.2008, no.36, pp.1254 - 1257 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/268707 | - |
| dc.language | English | - |
| dc.publisher | The Laser Society of Japan | - |
| dc.title | Advanced Optical Metrology Using Ultrashort Pulse Lasers | - |
| dc.type | Article | - |
| dc.type.rims | ART | - |
| dc.citation.volume | 2008 | - |
| dc.citation.issue | 36 | - |
| dc.citation.beginningpage | 1254 | - |
| dc.citation.endingpage | 1257 | - |
| dc.citation.publicationname | The Review of Laser Engineering | - |
| dc.contributor.localauthor | Kim, Seung-Woo | - |
| dc.contributor.localauthor | KIM, Young-Jin | - |
| dc.description.isOpenAccess | N | - |
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