DC Field | Value | Language |
---|---|---|
dc.contributor.author | Kim, Min Hyuk | ko |
dc.contributor.author | Nam, Giljoo | ko |
dc.contributor.author | Lee, Joo Ho | ko |
dc.date.accessioned | 2019-09-19T01:20:25Z | - |
dc.date.available | 2019-09-19T01:20:25Z | - |
dc.date.issued | 2019-05-07 | - |
dc.identifier.uri | http://hdl.handle.net/10203/267581 | - |
dc.description.abstract | Disclosed is a system for simultaneously measuring a surface normal vector and a surface reflection function in microscale. The system includes a light dome having a hemispherical-shaped structure and including LEDs to radiate light to an object placed therein; a macro lens installed camera arranged over the light dome to photograph the object through a hole formed at a center of the light dome under an environment in which a light is radiated from the light dome; an xyz micro-translation stage arranged under the light dome and configured to move in xyz-directions to adjust a focal distance between the macro lens installed camera and the object, and a measurement unit configured to control the light dome and the macro lens installed camera to obtain a microscale image, and configured to simultaneously measure a surface normal vector and a surface reflection function of the object based on the microscale image. | - |
dc.title | Method and system for simultaneously measuring surface normal vector and surface reflectance function in microscale | - |
dc.title.alternative | 마이크로스케일에서의 표면 법선 벡터 및 표면 반사 함수 동시 측정 방법 및 시스템 | - |
dc.type | Patent | - |
dc.type.rims | PAT | - |
dc.contributor.localauthor | Kim, Min Hyuk | - |
dc.contributor.assignee | KAIST | - |
dc.identifier.iprsType | 특허 | - |
dc.identifier.patentApplicationNumber | 15427821 | - |
dc.identifier.patentRegistrationNumber | 10281396 | - |
dc.date.application | 2017-02-08 | - |
dc.date.registration | 2019-05-07 | - |
dc.publisher.country | US | - |
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