A 9.1-ENOB 6-mW 10-Bit 500-MS/s Pipelined-SAR ADC With Current-Mode Residue Processing in 28-nm CMOS

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dc.contributor.authorMoon, Kyoung-Junko
dc.contributor.authorJo, Dong-Shinko
dc.contributor.authorKim, Wanko
dc.contributor.authorChoi, Michaelko
dc.contributor.authorKo, Hyung-Jongko
dc.contributor.authorRyu, Seung-Takko
dc.date.accessioned2019-09-17T07:20:11Z-
dc.date.available2019-09-17T07:20:11Z-
dc.date.created2019-09-17-
dc.date.created2019-09-17-
dc.date.issued2019-09-
dc.identifier.citationIEEE JOURNAL OF SOLID-STATE CIRCUITS, v.54, no.9, pp.2532 - 2542-
dc.identifier.issn0018-9200-
dc.identifier.urihttp://hdl.handle.net/10203/267524-
dc.description.abstractThis paper introduces a current-mode residue processing technique in a pipelined-successive-approximation register (SAR) analog-to-digital converter (ADC), which extends the operation speed of a single-channel ADC utilizing low-impedance-based signaling. A 10-bit pipelined-SAR ADC with featured building blocks such as a degenerated gm-cell as an open-loop residue amplifier, a switched-current mirror for sample-and-hold (S/H) function, and a split current digital-to-analog converter (DAC) for current-domain SAR conversion achieves a 500-MS/s conversion-rate under a 1.0-V supply. With background inter-stage mismatch calibration, a prototype ADC fabricated in a 28-nm CMOS process achieves 56.6-dB signal-to-noise-and-distortion ratio (SNDR) at a Nyquist input, resulting in a Walden figure of merit (FoM) of a 21.7-fJ/conversion-step.-
dc.languageEnglish-
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC-
dc.titleA 9.1-ENOB 6-mW 10-Bit 500-MS/s Pipelined-SAR ADC With Current-Mode Residue Processing in 28-nm CMOS-
dc.typeArticle-
dc.identifier.wosid000482625000016-
dc.identifier.scopusid2-s2.0-85071606680-
dc.type.rimsART-
dc.citation.volume54-
dc.citation.issue9-
dc.citation.beginningpage2532-
dc.citation.endingpage2542-
dc.citation.publicationnameIEEE JOURNAL OF SOLID-STATE CIRCUITS-
dc.identifier.doi10.1109/JSSC.2019.2926648-
dc.contributor.localauthorRyu, Seung-Tak-
dc.contributor.nonIdAuthorJo, Dong-Shin-
dc.contributor.nonIdAuthorKim, Wan-
dc.contributor.nonIdAuthorChoi, Michael-
dc.contributor.nonIdAuthorKo, Hyung-Jong-
dc.description.isOpenAccessN-
dc.type.journalArticleArticle-
dc.subject.keywordAuthorAnalog to digital converter (ADC)-
dc.subject.keywordAuthorcurrent-domain-
dc.subject.keywordAuthorcurrent-mode residue processing-
dc.subject.keywordAuthorgm-cell-
dc.subject.keywordAuthoropen-loop amplifier-
dc.subject.keywordAuthorpipelined-successive-approximation register (SAR)-
dc.subject.keywordAuthorsplit current digital-to-analog converter (DAC)-
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