Direct attachment of carbon nanotube on scanning probe tip using dielectrophoresis

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Publisher
International Society for Optical Engineering (SPIE)
Issue Date
2003-12-10
Language
ENG
Description

Copyright 2003 Society of Photo-Optical Instrumentation Engineers.

Citation

SPIE International Symposium of Microelectronics, MEMS and Nanotechnology, v.5275, pp.239 - 246

ISSN
0277-786X
URI
http://hdl.handle.net/10203/2668
Appears in Collection
ME-Conference Papers(학술회의논문)
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