Showing results 2 to 3 of 3
Fluorescent microscopy beyond diffraction limits using speckle illumination and joint support recovery Min, Junhong; Jang, Jaeduck; Keum, Dongmin; Ryu, Seung_Wook; Choi, Chulhee; Jeong, KI-HUN; Ye, Jong Chul, SCIENTIFIC REPORTS, v.3, 2013-06 |
Topological sensitivity based far-field detection of elastic inclusions Abbas, Tasawar; Khan, Shujaat; Sajid, Muhammad; Wahab, Abdul; Ye, Jong Chul, RESULTS IN PHYSICS, v.8, pp.442 - 460, 2018-03 |
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