DC Field | Value | Language |
---|---|---|
dc.contributor.author | Kim, Taek-Soo | ko |
dc.contributor.author | Tsuji, N | ko |
dc.contributor.author | van der Hilst, J | ko |
dc.contributor.author | Matsushita, K | ko |
dc.contributor.author | Kobayashi, N | ko |
dc.contributor.author | Chumakov, D | ko |
dc.contributor.author | Geisler, H | ko |
dc.contributor.author | Zshech, E | ko |
dc.contributor.author | R.H. Dauskardt | ko |
dc.date.accessioned | 2019-04-16T03:52:44Z | - |
dc.date.available | 2019-04-16T03:52:44Z | - |
dc.date.created | 2014-01-14 | - |
dc.date.issued | 2008-01-01 | - |
dc.identifier.citation | Advanced Metallization Conference | - |
dc.identifier.uri | http://hdl.handle.net/10203/260386 | - |
dc.language | English | - |
dc.publisher | Advanced Metallization Conference | - |
dc.title | Tuning Depth Profiles of Low-k Dielectrics with UV Curing | - |
dc.type | Conference | - |
dc.type.rims | CONF | - |
dc.citation.publicationname | Advanced Metallization Conference | - |
dc.identifier.conferencecountry | US | - |
dc.identifier.conferencelocation | San Diego | - |
dc.contributor.localauthor | Kim, Taek-Soo | - |
dc.contributor.nonIdAuthor | Tsuji, N | - |
dc.contributor.nonIdAuthor | van der Hilst, J | - |
dc.contributor.nonIdAuthor | Matsushita, K | - |
dc.contributor.nonIdAuthor | Kobayashi, N | - |
dc.contributor.nonIdAuthor | Chumakov, D | - |
dc.contributor.nonIdAuthor | Geisler, H | - |
dc.contributor.nonIdAuthor | Zshech, E | - |
dc.contributor.nonIdAuthor | R.H. Dauskardt | - |
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