DC Field | Value | Language |
---|---|---|
dc.contributor.author | Kim, Joungho | ko |
dc.contributor.author | Heegon Kim | ko |
dc.contributor.author | Jonghyun Cho | ko |
dc.contributor.author | Daniel H. Jung | ko |
dc.contributor.author | Jonghoon J | ko |
dc.contributor.author | Jun So Pak | ko |
dc.date.accessioned | 2019-04-16T03:30:31Z | - |
dc.date.available | 2019-04-16T03:30:31Z | - |
dc.date.created | 2013-06-26 | - |
dc.date.created | 2013-06-26 | - |
dc.date.issued | 2010-09-14 | - |
dc.identifier.citation | 2012 International Microelectronics and Packaging Society | - |
dc.identifier.uri | http://hdl.handle.net/10203/260219 | - |
dc.language | English | - |
dc.publisher | IEEE | - |
dc.title | Measurement-based Signal Quality Test of High-speed TSV Channel | - |
dc.type | Conference | - |
dc.identifier.scopusid | 2-s2.0-84876905977 | - |
dc.type.rims | CONF | - |
dc.citation.publicationname | 2012 International Microelectronics and Packaging Society | - |
dc.identifier.conferencecountry | US | - |
dc.contributor.localauthor | Kim, Joungho | - |
dc.contributor.nonIdAuthor | Heegon Kim | - |
dc.contributor.nonIdAuthor | Jonghyun Cho | - |
dc.contributor.nonIdAuthor | Daniel H. Jung | - |
dc.contributor.nonIdAuthor | Jonghoon J | - |
dc.contributor.nonIdAuthor | Jun So Pak | - |
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