DC Field | Value | Language |
---|---|---|
dc.contributor.author | Lee, Soon-Bok | ko |
dc.date.accessioned | 2019-04-16T01:32:43Z | - |
dc.date.available | 2019-04-16T01:32:43Z | - |
dc.date.created | 2014-01-14 | - |
dc.date.issued | 2012-05-16 | - |
dc.identifier.citation | APCFS-MM 2012 | - |
dc.identifier.uri | http://hdl.handle.net/10203/259698 | - |
dc.language | English | - |
dc.publisher | APCFS-MM 2012 | - |
dc.title | Material characterization of thin films for micro/nano scale applications | - |
dc.type | Conference | - |
dc.type.rims | CONF | - |
dc.citation.publicationname | APCFS-MM 2012 | - |
dc.identifier.conferencecountry | KO | - |
dc.identifier.conferencelocation | 부산 | - |
dc.contributor.localauthor | Lee, Soon-Bok | - |
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