Point-scanning based structured illumination microscopy
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Wanhee Chun | ko |
| dc.contributor.author | Dukho Do | ko |
| dc.contributor.author | Gweon, Dae-Gab | ko |
| dc.date.accessioned | 2019-04-15T22:52:08Z | - |
| dc.date.available | 2019-04-15T22:52:08Z | - |
| dc.date.created | 2013-07-03 | - |
| dc.date.issued | 2013-03-26 | - |
| dc.identifier.citation | Focus on Microscopy 2013 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/258901 | - |
| dc.language | English | - |
| dc.publisher | FOM | - |
| dc.title | Point-scanning based structured illumination microscopy | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.citation.publicationname | Focus on Microscopy 2013 | - |
| dc.identifier.conferencecountry | NE | - |
| dc.contributor.localauthor | Gweon, Dae-Gab | - |
| dc.contributor.nonIdAuthor | Wanhee Chun | - |
| dc.contributor.nonIdAuthor | Dukho Do | - |
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