Migration pathway and barrier for B diffusion in defected interfaces between Si and alpha quartz SiO2
- Publisher
- KIAS
- Issue Date
- 2013-06
- Language
- Korean
- Citation
The 9th KIAS Electronic Structure Calculation Workshop
- Appears in Collection
- PH-Conference Papers(학술회의논문)
- Files in This Item
- There are no files associated with this item.
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