DC Field | Value | Language |
---|---|---|
dc.contributor.author | 시스템생성자 | ko |
dc.contributor.author | 은광용 | ko |
dc.contributor.author | 전동일 | ko |
dc.contributor.author | 김도연 | ko |
dc.date.accessioned | 2019-04-15T19:54:25Z | - |
dc.date.available | 2019-04-15T19:54:25Z | - |
dc.date.issued | 1991-04-25 | - |
dc.identifier.uri | http://hdl.handle.net/10203/257890 | - |
dc.title | TIC계서메트의특성개선방법 | - |
dc.title.alternative | The method for improving characteristic of the TiC system cermet | - |
dc.type | Patent | - |
dc.type.rims | PAT | - |
dc.contributor.localauthor | 시스템생성자 | - |
dc.contributor.nonIdAuthor | 은광용 | - |
dc.contributor.nonIdAuthor | 전동일 | - |
dc.contributor.nonIdAuthor | 김도연 | - |
dc.contributor.assignee | KAIST | - |
dc.identifier.iprsType | 특허 | - |
dc.identifier.patentApplicationNumber | 10-1988-0005582 | - |
dc.identifier.patentRegistrationNumber | 10-0041407-0000 | - |
dc.date.application | 1988-05-13 | - |
dc.date.registration | 1991-04-25 | - |
dc.publisher.country | KO | - |
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