Interfacial reaction in graphene oxide RRAM device probed by scanning transmission X-ray microscopy
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Jong Yun Kim | ko |
| dc.contributor.author | Hyun Woo Nho | ko |
| dc.contributor.author | Jin Bae Kim | ko |
| dc.contributor.author | Jian Wang | ko |
| dc.contributor.author | Hyun-Joon Shin | ko |
| dc.contributor.author | Tae Hyun Yoon | ko |
| dc.contributor.author | Choi, Sung-Yool | ko |
| dc.date.accessioned | 2019-04-15T19:50:58Z | - |
| dc.date.available | 2019-04-15T19:50:58Z | - |
| dc.date.created | 2013-11-06 | - |
| dc.date.created | 2013-11-06 | - |
| dc.date.issued | 2013-07-12 | - |
| dc.identifier.citation | NANO KOREA 2013 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/257786 | - |
| dc.language | English | - |
| dc.publisher | NANO KOREA 2013 | - |
| dc.title | Interfacial reaction in graphene oxide RRAM device probed by scanning transmission X-ray microscopy | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.citation.publicationname | NANO KOREA 2013 | - |
| dc.identifier.conferencecountry | KO | - |
| dc.identifier.conferencelocation | 서울(Coex) | - |
| dc.contributor.localauthor | Choi, Sung-Yool | - |
| dc.contributor.nonIdAuthor | Jong Yun Kim | - |
| dc.contributor.nonIdAuthor | Hyun Woo Nho | - |
| dc.contributor.nonIdAuthor | Jin Bae Kim | - |
| dc.contributor.nonIdAuthor | Jian Wang | - |
| dc.contributor.nonIdAuthor | Hyun-Joon Shin | - |
| dc.contributor.nonIdAuthor | Tae Hyun Yoon | - |
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