Various Monitoring and Nondestructive Testing Applications: From Micro-scale to Large-scale Structures
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Sohn, Hoon | ko |
| dc.contributor.author | An, Yun-Kyu | ko |
| dc.date.accessioned | 2019-04-15T19:50:06Z | - |
| dc.date.available | 2019-04-15T19:50:06Z | - |
| dc.date.created | 2013-10-31 | - |
| dc.date.created | 2013-10-31 | - |
| dc.date.issued | 2013-07-21 | - |
| dc.identifier.citation | The 9th International Workshop on Advanced Smart Materials and Smart Structures Technology (ANCRiSST 2013) | - |
| dc.identifier.uri | http://hdl.handle.net/10203/257758 | - |
| dc.language | English | - |
| dc.publisher | Asian-Pacific Network of Centers for Research in Smart Structures Technology (ANCRiSST) | - |
| dc.title | Various Monitoring and Nondestructive Testing Applications: From Micro-scale to Large-scale Structures | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.citation.publicationname | The 9th International Workshop on Advanced Smart Materials and Smart Structures Technology (ANCRiSST 2013) | - |
| dc.identifier.conferencecountry | KO | - |
| dc.identifier.conferencelocation | UNIST, Korea | - |
| dc.contributor.localauthor | Sohn, Hoon | - |
| dc.contributor.nonIdAuthor | An, Yun-Kyu | - |
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