Nanoprobing Charge Transport Properties of Strained and Indented Topological Insulator

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dc.contributor.authorHwang, Jin Heuiko
dc.contributor.authorKwon, Sangkuko
dc.contributor.authorPark, Joonbumko
dc.contributor.authorLee, Jinhwanko
dc.contributor.authorKim, Jun Sungko
dc.contributor.authorLyeo, Ho-Kiko
dc.contributor.authorPark, JeongYoungko
dc.date.accessioned2019-04-15T19:12:01Z-
dc.date.available2019-04-15T19:12:01Z-
dc.date.created2014-01-13-
dc.date.issued2013-08-23-
dc.identifier.citation한국진공학회 제 45회 하계학술대회-
dc.identifier.urihttp://hdl.handle.net/10203/257523-
dc.languageKorean-
dc.publisher한국진공학회-
dc.titleNanoprobing Charge Transport Properties of Strained and Indented Topological Insulator-
dc.typeConference-
dc.type.rimsCONF-
dc.citation.publicationname한국진공학회 제 45회 하계학술대회-
dc.identifier.conferencecountryKO-
dc.identifier.conferencelocation디오션리조트-
dc.contributor.localauthorPark, JeongYoung-
dc.contributor.nonIdAuthorHwang, Jin Heui-
dc.contributor.nonIdAuthorKwon, Sangku-
dc.contributor.nonIdAuthorPark, Joonbum-
dc.contributor.nonIdAuthorLee, Jinhwan-
dc.contributor.nonIdAuthorKim, Jun Sung-
dc.contributor.nonIdAuthorLyeo, Ho-Ki-
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EEW-Conference Papers(학술회의논문)
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