Atomic Force Microscopy Studies of Charge Transport Properties of Strained and Indented Topological Insulator
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Hwang, Jin Heui | ko |
| dc.contributor.author | Kwon, Sangku | ko |
| dc.contributor.author | Park, J | ko |
| dc.contributor.author | Lee, J | ko |
| dc.contributor.author | Lyeo, Ho-Ki | ko |
| dc.contributor.author | Park, JeongYoung | ko |
| dc.date.accessioned | 2019-04-15T17:32:16Z | - |
| dc.date.available | 2019-04-15T17:32:16Z | - |
| dc.date.created | 2014-01-13 | - |
| dc.date.issued | 2013-10-29 | - |
| dc.identifier.citation | AVS 60th International Symposium & Exhibition | - |
| dc.identifier.uri | http://hdl.handle.net/10203/256646 | - |
| dc.language | English | - |
| dc.publisher | American Vacuum Society | - |
| dc.title | Atomic Force Microscopy Studies of Charge Transport Properties of Strained and Indented Topological Insulator | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.citation.publicationname | AVS 60th International Symposium & Exhibition | - |
| dc.identifier.conferencecountry | US | - |
| dc.identifier.conferencelocation | Long Beach, CA | - |
| dc.contributor.localauthor | Park, JeongYoung | - |
| dc.contributor.nonIdAuthor | Hwang, Jin Heui | - |
| dc.contributor.nonIdAuthor | Kwon, Sangku | - |
| dc.contributor.nonIdAuthor | Park, J | - |
| dc.contributor.nonIdAuthor | Lee, J | - |
| dc.contributor.nonIdAuthor | Lyeo, Ho-Ki | - |
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