DC Field | Value | Language |
---|---|---|
dc.contributor.author | Yonghun Kim | ko |
dc.contributor.author | Seung-heon Baek | ko |
dc.contributor.author | Changhoon Jeon | ko |
dc.contributor.author | Young Gon Lee | ko |
dc.contributor.author | JinJu Kim | ko |
dc.contributor.author | Ukjin Jung | ko |
dc.contributor.author | Lee, Seok-Hee | ko |
dc.contributor.author | Byoung Hun Lee | ko |
dc.date.accessioned | 2019-04-15T17:10:38Z | - |
dc.date.available | 2019-04-15T17:10:38Z | - |
dc.date.created | 2013-11-06 | - |
dc.date.issued | 2013-11-08 | - |
dc.identifier.citation | International Workshop on DIELECTRIC THIN FILMS FOR FUTURE ELECTRON DEVICES - SCIENCE AND TECHNOLOGY - (IWDTF), pp.113 - 114 | - |
dc.identifier.uri | http://hdl.handle.net/10203/256397 | - |
dc.language | English | - |
dc.publisher | The Japan Society of Applied Physics | - |
dc.title | Characterization of Ultra-Thin Dielectric Using Time Domain Reflectometry | - |
dc.type | Conference | - |
dc.type.rims | CONF | - |
dc.citation.beginningpage | 113 | - |
dc.citation.endingpage | 114 | - |
dc.citation.publicationname | International Workshop on DIELECTRIC THIN FILMS FOR FUTURE ELECTRON DEVICES - SCIENCE AND TECHNOLOGY - (IWDTF) | - |
dc.identifier.conferencecountry | JA | - |
dc.identifier.conferencelocation | University of Tsukuba, Tokyo, Japan | - |
dc.contributor.localauthor | Lee, Seok-Hee | - |
dc.contributor.nonIdAuthor | Yonghun Kim | - |
dc.contributor.nonIdAuthor | Seung-heon Baek | - |
dc.contributor.nonIdAuthor | Changhoon Jeon | - |
dc.contributor.nonIdAuthor | Young Gon Lee | - |
dc.contributor.nonIdAuthor | JinJu Kim | - |
dc.contributor.nonIdAuthor | Ukjin Jung | - |
dc.contributor.nonIdAuthor | Byoung Hun Lee | - |
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