Lithographic defect aware placement using compact standard cells without inter-cell margin
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Shim, Seongbo | ko |
| dc.contributor.author | Lee, Yoojong | ko |
| dc.contributor.author | Shin, Youngsoo | ko |
| dc.date.accessioned | 2019-04-15T16:13:59Z | - |
| dc.date.available | 2019-04-15T16:13:59Z | - |
| dc.date.created | 2014-11-26 | - |
| dc.date.created | 2014-11-26 | - |
| dc.date.created | 2014-11-26 | - |
| dc.date.issued | 2014-01-20 | - |
| dc.identifier.citation | Asia South Pacific Design Automation Conference, pp.47 - 52 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/255685 | - |
| dc.language | English | - |
| dc.publisher | IEEE | - |
| dc.title | Lithographic defect aware placement using compact standard cells without inter-cell margin | - |
| dc.type | Conference | - |
| dc.identifier.wosid | 000350791700016 | - |
| dc.identifier.scopusid | 2-s2.0-84897859701 | - |
| dc.type.rims | CONF | - |
| dc.citation.beginningpage | 47 | - |
| dc.citation.endingpage | 52 | - |
| dc.citation.publicationname | Asia South Pacific Design Automation Conference | - |
| dc.identifier.conferencecountry | SI | - |
| dc.identifier.conferencelocation | 싱가폴 | - |
| dc.contributor.localauthor | Shin, Youngsoo | - |
| dc.contributor.nonIdAuthor | Lee, Yoojong | - |
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