Electrical Characterization of Nanoscale Au/TiO2 Schottky Diodes Probed with Conductive Atomic Force Microscopy
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 이현수 | ko |
| dc.contributor.author | Lee, Young keun | ko |
| dc.contributor.author | Bae, Saebyuk | ko |
| dc.contributor.author | 박정영 | ko |
| dc.date.accessioned | 2019-04-15T15:35:02Z | - |
| dc.date.available | 2019-04-15T15:35:02Z | - |
| dc.date.created | 2014-06-26 | - |
| dc.date.issued | 2014-04-24 | - |
| dc.identifier.citation | 한국물리학회 2014년 봄 학술논문발표회 및 정기총회 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/255118 | - |
| dc.language | Korean | - |
| dc.publisher | 한국물리학회 | - |
| dc.title | Electrical Characterization of Nanoscale Au/TiO2 Schottky Diodes Probed with Conductive Atomic Force Microscopy | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.citation.publicationname | 한국물리학회 2014년 봄 학술논문발표회 및 정기총회 | - |
| dc.identifier.conferencecountry | KO | - |
| dc.identifier.conferencelocation | 대전컨벤션센터 | - |
| dc.contributor.localauthor | 박정영 | - |
| dc.contributor.nonIdAuthor | Lee, Young keun | - |
| dc.contributor.nonIdAuthor | Bae, Saebyuk | - |
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